Interferometry--techniques and analysis : 20-21 July 1992, San Diego, California /
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| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
c1993.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1755. |
| Subjects: |
| Item Description: | "The 1992 symposium was the fifth"--Introduction. |
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| Physical Description: | ix, 288 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819409286 |