Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] /

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Dettagli Bibliografici
Ente Autore: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods Durham, England
Altri autori: Bowen, D. Keith (David Keith), 1940-, Tanner, B. K. (Brian Keith)
Natura: Atti del Convegno Libro
Lingua:English
Pubblicazione: New York, N.Y. : Plenum Press, c1980.
Serie:NATO advanced study institutes series. Physics ; v. 63
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Descrizione
Descrizione del documento:"Published in cooperation with NATO Scientific Affairs Division."
Descrizione fisica:xxvi, 589 p. : ill. ; 26 cm.
Bibliografia:Includes bibliographical references and index.
ISBN:0306406284 (hbk.)