Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] /

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Bibliografiske detaljer
Institution som forfatter: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods Durham, England
Andre forfattere: Bowen, D. Keith (David Keith), 1940-, Tanner, B. K. (Brian Keith)
Format: Conference Proceeding Bog
Sprog:English
Udgivet: New York, N.Y. : Plenum Press, c1980.
Serier:NATO advanced study institutes series. Physics ; v. 63
Fag:
Beskrivelse
Emne beskrivelse:"Published in cooperation with NATO Scientific Affairs Division."
Fysisk beskrivelse:xxvi, 589 p. : ill. ; 26 cm.
Bibliografi:Includes bibliographical references and index.
ISBN:0306406284 (hbk.)