Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] /

में बचाया:
ग्रंथसूची विवरण
निगमित लेखक: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods Durham, England
अन्य लेखक: Bowen, D. Keith (David Keith), 1940-, Tanner, B. K. (Brian Keith)
स्वरूप: सम्मेलन की कार्यवाही पुस्तक
भाषा:English
प्रकाशित: New York, N.Y. : Plenum Press, c1980.
श्रृंखला:NATO advanced study institutes series. Physics ; v. 63
विषय:
विवरण
वस्तु वर्णन:"Published in cooperation with NATO Scientific Affairs Division."
भौतिक वर्णन:xxvi, 589 p. : ill. ; 26 cm.
ग्रन्थसूची:Includes bibliographical references and index.
आईएसबीएन:0306406284 (hbk.)