Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] - Bowen, D. Keith (David Keith), 1940-; Tanner, B. K. (Brian Keith) (NATO advanced study institutes series. Physics, 1980)