Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] /

Saved in:
Bibliografiske detaljer
Institution som forfatter: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods Durham, England
Andre forfattere: Bowen, D. Keith (David Keith), 1940-, Tanner, B. K. (Brian Keith)
Format: Conference Proceeding Bog
Sprog:English
Udgivet: New York, N.Y. : Plenum Press, c1980.
Serier:NATO advanced study institutes series. Physics ; v. 63
Fag:

CARM 1 Store

Detaljer om beholdninger fra CARM 1 Store
Kopi 1 Tilgængelig  Reservér”