Society of Photo-optical Instrumentation Engineers & Williams, C. C. (1993). Scanning probe microscopies II: 18-19 January 1993, Los Angeles, California. The International Society for Optical Engineering.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Clayton C. Williams. Scanning Probe Microscopies II: 18-19 January 1993, Los Angeles, California. Bellingham, Wash., USA: The International Society for Optical Engineering, 1993.
MLA (8th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Clayton C. Williams. Scanning Probe Microscopies II: 18-19 January 1993, Los Angeles, California. The International Society for Optical Engineering, 1993.
Warning: These citations may not always be 100% accurate.