Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California /
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| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
The International Society for Optical Engineering,
c1993.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1855. |
| Subjects: |
| Item Description: | Sponsored and published by SPIE-The International Society for Optical Engineering. |
|---|---|
| Physical Description: | ix, 220 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819410810 |