Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California /

Gespeichert in:
Bibliographische Detailangaben
Körperschaft: Society of Photo-optical Instrumentation Engineers
Weitere Verfasser: Williams, Clayton C. (Clayton Covey)
Format: Buch
Sprache:English
Veröffentlicht: Bellingham, Wash., USA : The International Society for Optical Engineering, c1993.
Schriftenreihe:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1855.
Schlagworte:
LEADER 01557cam a2200349 a 4500
001 c000399100
003 CARM
005 20150402150037.0
008 150402s1993 waua b 101 0 eng
010 |a 93083323 
019 1 |a 10647711  |5 LACONCORD2021 
020 |a 0819410810 
035 |a (OCoLC)29294002  |5 LACONCORD2021 
040 |a LC  |b eng  |c LC  |d LC 
050 0 |a QH212.S33  |b S373 1993 
082 0 0 |a 502/.8/25  |2 20 
245 0 0 |a Scanning probe microscopies II :  |b 18-19 January 1993, Los Angeles, California /  |c Edited by Clayton C. Williams, chair/editor. 
246 3 |a Scanning probe microscopies two 
260 |a Bellingham, Wash., USA :  |b The International Society for Optical Engineering,  |c c1993. 
300 |a ix, 220 p. :  |b ill. ;  |c 28 cm. 
490 1 |a SPIE proceedings series ;  |v v. 1855 
500 |a Sponsored and published by SPIE-The International Society for Optical Engineering. 
504 |a Includes bibliographical references and index. 
650 0 |a Scanning probe microscopy  |x Congresses. 
700 1 |a Williams, Clayton C.  |q (Clayton Covey) 
710 2 |a Society of Photo-optical Instrumentation Engineers. 
852 8 |b CARM  |p 0619275  |f BK 
852 8 |b SCAN  |h A3:AG09E0  |i F09075  |p 0619275  |f BK 
830 0 |a Proceedings of SPIE--the International Society for Optical Engineering ;  |v v. 1855. 
999 f f |i a2059e1e-4bb5-557a-9ce3-a407e04e6406  |s 7248dbd4-7023-59ea-b460-281ed96b491f 
952 f f |p Can circulate  |a CAVAL  |b CAVAL  |c CAVAL  |d CARM 1 Store  |i book  |m 0619275 
952 f f |a CAVAL  |b CAVAL  |c CAVAL  |d Unmapped Location  |e F09075  |f A3:AG09E0  |h Other scheme