Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California /
Wedi'i Gadw mewn:
| Awdur Corfforaethol: | |
|---|---|
| Awduron Eraill: | |
| Fformat: | Llyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Bellingham, Wash., USA :
The International Society for Optical Engineering,
c1993.
|
| Cyfres: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1855. |
| Pynciau: |
CARM 1 Store
| Copi 1 | Ar gael Gwneud Cais |
|---|