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  1. 1
    Semiconductor measurement technology : survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry /
    Book
    by Bullis, W. Murray, 1930-
    Published 1995
    Subjects: “…Semiconductors Testing Optical methods.…”
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  2. 2
    Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas /
    Book
    Published 1996
    Subjects: “…Semiconductors Testing Optical methods Congresses.…”
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