Unified methods for VLSI simulation and test generation /

Unified methods for VLSI simulation and test generation /

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Detalles Bibliográficos
Autor principal: Cheng, Kwang-Ting, 1961-
Otros Autores: Agrawal, Vishwani D., 1943-
Formato: Libro
Lenguaje:English
Publicado: Boston : Kluwer Academic Publishers, c1989.
Colección:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing #SECS 73
Materias:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Computer-aided design.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Computer simulation.

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