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01594nam a2200349 a 4500 |
| 001 |
c000014563 |
| 003 |
CARM |
| 005 |
00000000000000.0 |
| 008 |
890427s1989 maua b 00110 eng |
| 019 |
1 |
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|a 6471200
|5 LACONCORD2021
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| 020 |
|
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|a 0792390253
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| 035 |
|
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|a (OCoLC)19723668
|5 LACONCORD2021
|
| 040 |
|
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|d SCAE
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| 050 |
0 |
0 |
|a TK7874
|b .C525 1989
|
| 100 |
1 |
|
|a Cheng, Kwang-Ting,
|d 1961-
|
| 245 |
1 |
0 |
|a Unified methods for VLSI simulation and test generation /
|c by Kwang-Ting Cheng and Vishwani D. Agrawal.
|
| 260 |
|
|
|a Boston :
|b Kluwer Academic Publishers,
|c c1989.
|
| 300 |
|
|
|a xii, 148 p. :
|b ill. ;
|c 24 cm.
|
| 440 |
|
0 |
|a Kluwer international series in engineering and computer science.
|p VLSI, computer architecture, and digital signal processing
|v #SECS 73
|
| 500 |
|
|
|a At head of title: AT&T.
|
| 500 |
|
|
|a Includes index.
|
| 504 |
|
|
|a Bibliography: p. [113]-143.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Design and construction
|x Data processing.
|
| 650 |
|
0 |
|a Computer-aided design.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Computer simulation.
|
| 700 |
1 |
|
|a Agrawal, Vishwani D.,
|d 1943-
|
| 740 |
0 |
1 |
|a Unified methods for very large scale integration simulation and test generation.
|
| 852 |
8 |
|
|b CARM
|h A2:AJ21F0
|i C04643
|p 0190828
|f BK
|
| 082 |
0 |
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|a 621.39/5
|2 20
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| 999 |
f |
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|i 81772db1-e2cb-5004-a3f1-cfe776c370eb
|s 5704725d-e970-5f66-91a4-51b9a412687b
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| 952 |
f |
f |
|p Can circulate
|a CAVAL
|b CAVAL
|c CAVAL
|d CARM 1 Store
|e C04643
|f A2:AJ21F0
|h Other scheme
|i book
|m 0190828
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