Unified methods for VLSI simulation and test generation /

Unified methods for VLSI simulation and test generation /

保存先:
書誌詳細
第一著者: Cheng, Kwang-Ting, 1961-
その他の著者: Agrawal, Vishwani D., 1943-
フォーマット: 図書
言語:English
出版事項: Boston : Kluwer Academic Publishers, c1989.
シリーズ:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing #SECS 73
主題:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Computer-aided design.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Computer simulation.

CARM 1 Store

予約･返却請求 CARM 1 Store
請求記号: A2:AJ21F0 C04643
所蔵 1 利用可  予約する

類似資料