The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 /

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 /

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Bibliographic Details
Corporate Authors: International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers (U.S.). Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Silver Spring, MD : IEEE Computer Society Press, c1984.
Subjects:
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.

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