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01736nam a2200361 a 4500 |
| 001 |
c000053649 |
| 003 |
CARM |
| 005 |
00000000000000.0 |
| 008 |
850523s1984 mdua b 10110 eng |
| 019 |
1 |
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|a 3885290
|5 LACONCORD2021
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| 020 |
|
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|a 0818605480 (pbk.)
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| 020 |
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|a 0818645482 (microfiche)
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| 020 |
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|a 0818685484 (hard)
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| 035 |
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|a (OCoLC)39364650
|5 LACONCORD2021
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| 050 |
0 |
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|a TK7874
|b .I593 1984
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| 111 |
2 |
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|a International Test Conference
|n (15th :
|d 1984 :
|c Philadelphia, Pa.)
|
| 245 |
1 |
4 |
|a The three faces of test :
|b design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 /
|c sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
|
| 260 |
|
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|a Silver Spring, MD :
|b IEEE Computer Society Press,
|c c1984.
|
| 300 |
|
|
|a xxxi, 886 p. :
|b ill. ;
|c 28 cm.
|
| 500 |
|
|
|a Spine title: International Test Conference 1984 proceedings.
|
| 500 |
|
|
|a "IEEE catalog no. 84CH2084-2."
|
| 500 |
|
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|a "Computer Society order no. 548."
|
| 504 |
|
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|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing
|x Congresses.
|
| 650 |
|
0 |
|a Semiconductors
|x Testing
|x Congresses.
|
| 710 |
2 |
0 |
|a IEEE Computer Society.
|b Test Technology Committee.
|
| 710 |
2 |
0 |
|a Institute of Electrical and Electronics Engineers (U.S.).
|b Philadelphia Section.
|
| 740 |
0 |
1 |
|a International Test Conference 1984 proceedings.
|
| 740 |
0 |
1 |
|a 3 faces of test.
|
| 852 |
8 |
|
|b CARM
|h A3:AB07C2
|i D01817
|p 0094814
|f BK
|
| 082 |
0 |
4 |
|a 621.381/73/0287
|2 19
|
| 999 |
f |
f |
|i d153d6da-dd98-5c89-94c3-9d21947076fe
|s 0f01baaa-ad69-5a1f-899f-38dde101e022
|
| 952 |
f |
f |
|p Can circulate
|a CAVAL
|b CAVAL
|c CAVAL
|d CARM 1 Store
|e D01817
|f A3:AB07C2
|h Other scheme
|i book
|m 0094814
|