IEEE design & test of computers /
Saved in:
| Corporate Authors: | , |
|---|---|
| Format: | Journal |
| Language: | English |
| Published: |
Los Alamitos, CA :
IEEE Computer Society,
c1984-
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| Subjects: | |
| Online Access: | Click on "Go to IEL", then "Search", then "Journals"; scroll down to: IEEE Design & Test of Computers. http://ieeexplore.ieee.org/servlet/opac?punumber=54 |
Internet
Click on "Go to IEL", then "Search", then "Journals"; scroll down to: IEEE Design & Test of Computers.http://ieeexplore.ieee.org/servlet/opac?punumber=54
CARM 1 Store
| Call Number: |
A3:AD12C0 D07005 |
|---|---|
| Copy 1 | Available Place a Hold |