IEEE Computer Society Conference on Pattern Recognition and Image Processing : proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York.

IEEE Computer Society Conference on Pattern Recognition and Image Processing : proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York.

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Autor corporatiu: IEEE Computer Society Conference on Pattern Recognition and Image Processing, Rensselaer Polytechnic Institute, IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis
Format: Actes de congresos Llibre
Idioma:English
Publicat: Long Beach, Calif. : The Society, c1977.
Matèries:
Pattern perception > Congresses.
Image processing > Congresses.
Optical character recognition devices > Congresses.

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