IEEE Computer Society Conference on Pattern Recognition and Image Processing : proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York.

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Détails bibliographiques
Collectivités auteurs: IEEE Computer Society Conference on Pattern Recognition and Image Processing, Rensselaer Polytechnic Institute, IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis
Format: Actes de congrès Livre
Langue:English
Publié: Long Beach, Calif. : The Society, c1977.
Sujets:
Description
Description:Sponsored by the Machine Intelligence and Pattern Analysis Committee of the IEEE Computer Society.
"77CH1208-9C."
Cover title: IEEE 1977 Pattern recognition & image processing.
Description matérielle:xi, 399 p. : ill. ; 28 cm.
Bibliographie:Includes bibliographical references.