IEEE Computer Society Conference on Pattern Recognition and Image Processing : proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York.

IEEE Computer Society Conference on Pattern Recognition and Image Processing : proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York.

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Bibliografische gegevens
Coauteurs: IEEE Computer Society Conference on Pattern Recognition and Image Processing, Rensselaer Polytechnic Institute, IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis
Formaat: Conferentie akten Boek
Taal:English
Gepubliceerd in: Long Beach, Calif. : The Society, c1977.
Onderwerpen:
Pattern perception > Congresses.
Image processing > Congresses.
Optical character recognition devices > Congresses.
Omschrijving
Beschrijving item:Sponsored by the Machine Intelligence and Pattern Analysis Committee of the IEEE Computer Society.
"77CH1208-9C."
Cover title: IEEE 1977 Pattern recognition & image processing.
Fysieke beschrijving:xi, 399 p. : ill. ; 28 cm.
Bibliografie:Includes bibliographical references.

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