Measurement of transistor scattering parameters /
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Awduron Eraill: | , |
| Fformat: | Llyfr |
| Iaith: | English |
| Cyhoeddwyd: |
[Washington] :
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1975.
|
| Cyfres: | Semiconductor measurement technology
NBS special publication ; 400-5. |
| Pynciau: |
CARM 1 Store
| Rhif Galw: |
A2:AF37H0 F01034 |
|---|---|
| Copi 1 | Ar gael Gwneud Cais |