Measurement of transistor scattering parameters /
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
[Washington] :
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1975.
|
| Series: | Semiconductor measurement technology
NBS special publication ; 400-5. |
| Subjects: |
| LEADER | 01491cam a2200349 a 4500 | ||
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| 003 | CARM | ||
| 005 | 20060929160829.0 | ||
| 008 | 750718s1975 dcua b f000 0 eng | ||
| 010 | |a 74600204 | ||
| 019 | 1 | |a 359692 |5 LACONCORD2021 | |
| 035 | |a (OCoLC)1551167 |5 LACONCORD2021 | ||
| 040 | |a LC |b eng |c LC |d NUN | ||
| 050 | 0 | 0 | |a QC100 |b .U57 no. 400-5 |a TK7871.9 |
| 082 | 0 | 4 | |a 389/.08 s |
| 082 | 0 | 4 | |a 621.3815/28/028 |
| 100 | 1 | |a Rogers, George J. | |
| 245 | 1 | 0 | |a Measurement of transistor scattering parameters / |c George J. Rogers and David E. Sawyer, Ramon L. Jesch. |
| 260 | |a [Washington] : |b U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., |c 1975. | ||
| 300 | |a iv, 48 p. : |b ill. ; |c 26 cm. | ||
| 440 | 0 | |a Semiconductor measurement technology | |
| 490 | 1 | |a NBS special publication ; |v 400-5 | |
| 500 | |a "Jointly sponsored by the National Bureau of Standards and the Air Force Weapons Laboratory." | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Transistors |x Testing. | |
| 650 | 0 | |a Electronic measurements. | |
| 700 | 1 | |a Sawyer, David E, |e joint author. | |
| 700 | 1 | |a Jesch, Ramon L, |e joint author. | |
| 830 | 0 | |a NBS special publication ; |v 400-5. | |
| 852 | 8 | |b CARM |h A2:AF37H0 |i F01034 |p 0315296 |f BK | |
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