Measurement of transistor scattering parameters /
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| Hlavní autor: | |
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| Další autoři: | , |
| Médium: | Kniha |
| Jazyk: | English |
| Vydáno: |
[Washington] :
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1975.
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| Edice: | Semiconductor measurement technology
NBS special publication ; 400-5. |
| Témata: |
CARM 1 Store
| Signatura: |
A2:AF37H0 F01034 |
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| Jednotka 1 | Dostupné Požadavek |