Measurement of transistor scattering parameters /
Saved in:
| Main Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
[Washington] :
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1975.
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| Series: | Semiconductor measurement technology
NBS special publication ; 400-5. |
| Subjects: |
CARM 1 Store
| Call Number: |
A2:AF37H0 F01034 |
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| Copy 1 | Available Place a Hold |