Yield and variability optimization of integrated circuits /

Yield and variability optimization of integrated circuits /

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Bibliographic Details
Main Author: Zhang, J. C., 1963-
Other Authors: Styblinski, M. A., 1942-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, c1995.
Subjects:
Integrated circuits > Design and construction > Statistical methods.
Integrated circuits > Reliability.
Integrated circuits > Defects.
Description
Item Description:Includes index.
Physical Description:xv, 234 p. : ill. ; 25 cm.
Bibliography:Bibliography: p. 221-231.
ISBN:0792395514 (acid-free paper)

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