Yield and variability optimization of integrated circuits /

Yield and variability optimization of integrated circuits /

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Bibliografiske detaljer
Hovedforfatter: Zhang, J. C., 1963-
Andre forfattere: Styblinski, M. A., 1942-
Format: Bog
Sprog:English
Udgivet: Boston : Kluwer Academic Publishers, c1995.
Fag:
Integrated circuits > Design and construction > Statistical methods.
Integrated circuits > Reliability.
Integrated circuits > Defects.
Beskrivelse
Emne beskrivelse:Includes index.
Fysisk beskrivelse:xv, 234 p. : ill. ; 25 cm.
Bibliografi:Bibliography: p. 221-231.
ISBN:0792395514 (acid-free paper)

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