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| LEADER |
01526cam a2200325 a 4500 |
| 001 |
c000225183 |
| 003 |
CARM |
| 005 |
20061106114914.0 |
| 008 |
941205s1995 maua b 001 0 eng |
| 010 |
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|a 94044624
|
| 019 |
1 |
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|a 11388765
|5 LACONCORD2021
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| 020 |
|
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|a 0792395514 (acid-free paper)
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| 035 |
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|a (OCoLC)31756305
|5 LACONCORD2021
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| 040 |
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|a TOC
|b eng
|c TOC
|d XNTU
|
| 050 |
0 |
0 |
|a TK7874
|b .Z43 1995
|
| 082 |
0 |
4 |
|a 621.3815
|2 20
|
| 100 |
1 |
|
|a Zhang, J. C.,
|d 1963-
|
| 245 |
1 |
0 |
|a Yield and variability optimization of integrated circuits /
|c J.C. Zhang, M.A. Styblinski.
|
| 260 |
|
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|a Boston :
|b Kluwer Academic Publishers,
|c c1995.
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| 300 |
|
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|a xv, 234 p. :
|b ill. ;
|c 25 cm.
|
| 500 |
|
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|a Includes index.
|
| 504 |
|
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|a Bibliography: p. 221-231.
|
| 505 |
0 |
|
|a 1. Introduction -- 2. Overview of IC Statistical Modeling -- 3. Design of Experiments -- 4. Parametric Yield Maximization -- 5. Variability Minimization and Tuning -- 6. Worst-Case Measure Reduction -- 7. Multi-Objective Circuit Optimization -- A Commonly Used Orthogonal Arrays -- B Spice3 Input Decks.
|
| 650 |
|
0 |
|a Integrated circuits
|x Design and construction
|x Statistical methods.
|
| 650 |
|
0 |
|a Integrated circuits
|x Reliability.
|
| 650 |
|
0 |
|a Integrated circuits
|x Defects.
|
| 700 |
1 |
|
|a Styblinski, M. A.,
|d 1942-
|
| 852 |
8 |
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|b CARM
|h A2:AN27G0
|i C08386
|p 0314650
|f BK
|
| 999 |
f |
f |
|i 8a5222ba-bd69-58d3-a58f-380b6da6f556
|s 210f1b7b-222a-5507-b9fd-52f98f5232e6
|
| 952 |
f |
f |
|p Can circulate
|a CAVAL
|b CAVAL
|c CAVAL
|d CARM 1 Store
|e C08386
|f A2:AN27G0
|h Other scheme
|i book
|m 0314650
|