Yield and variability optimization of integrated circuits /

Yield and variability optimization of integrated circuits /

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Bibliografski detalji
Glavni autor: Zhang, J. C., 1963-
Daljnji autori: Styblinski, M. A., 1942-
Format: Knjiga
Jezik:English
Izdano: Boston : Kluwer Academic Publishers, c1995.
Teme:
Integrated circuits > Design and construction > Statistical methods.
Integrated circuits > Reliability.
Integrated circuits > Defects.
Sadržaj:
  • 1. Introduction
  • 2. Overview of IC Statistical Modeling
  • 3. Design of Experiments
  • 4. Parametric Yield Maximization
  • 5. Variability Minimization and Tuning
  • 6. Worst-Case Measure Reduction
  • 7. Multi-Objective Circuit Optimization
  • A Commonly Used Orthogonal Arrays
  • B Spice3 Input Decks.

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