User's manual for the program MONSEL-1 : Monte Carlo simulation of SEM signals for linewidth metrology /
में बचाया:
मुख्य लेखक: | |
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निगमित लेखक: | |
अन्य लेखक: | |
स्वरूप: | पुस्तक |
भाषा: | English |
प्रकाशित: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1994.
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श्रृंखला: | Semiconductor measurement technology
NIST special publication ; 400-95 |
विषय: |
LEADER | 01640cam a2200313 a 4500 | ||
---|---|---|---|
001 | c000225740 | ||
003 | CARM | ||
005 | 20061123111805.0 | ||
008 | 950223s1994 mdua b f000 0 eng d | ||
019 | 1 | |a 22765233 |z 54275310 |5 LACONCORD2021 | |
035 | |a (OCoLC)32040836 |5 LACONCORD2021 | ||
040 | |a NRL |b eng |c NRL |d OCL |d UWA |d OCoLC | ||
100 | 1 | |a Lowney, J. R. |q (Jeremiah Ralph), |d 1946- | |
245 | 1 | 0 | |a User's manual for the program MONSEL-1 : |b Monte Carlo simulation of SEM signals for linewidth metrology / |c Jeremiah R. Lowney and Egon Marx. |
260 | |a Gaithersburg, MD : |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; |a Washington, DC : |b For sale by the Supt. of Docs., U.S. G.P.O., |c 1994. | ||
300 | |a iv, 39 p. : |b ill. ; |c 28 cm. | ||
440 | 0 | |a Semiconductor measurement technology | |
440 | 0 | |a NIST special publication ; |v 400-95 | |
500 | |a Distributed to depository libraries in microfiche. | ||
500 | |a "August 1994." | ||
504 | |a Includes bibliographical references. | ||
650 | 0 | |a Scanning electron microscopy |x Computer programs |v Handbooks, manuals, etc. | |
650 | 0 | |a Electrons |x Scattering |x Mathematical models |x Computer programs |v Handbooks, manuals, etc. | |
650 | 0 | |a Monte Carlo method |x Computer programs |v Handbooks, manuals, etc. | |
700 | 1 | |a Marx, Egon. | |
710 | 2 | |a National Institute of Standards and Technology (U.S.) | |
852 | 8 | |b CARM |h A2:AF26H0 |i F01125 |p 0268078 |f BK | |
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