Potzick, J. E. (1997). Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.
Citace podle Chicago (17th ed.)Potzick, James E. Antireflecting-chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems. Gaithersburg, MD : Washington, D.C.: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O, 1997.
Citace podle MLA (8th ed.)Potzick, James E. Antireflecting-chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O, 1997.