VLSI testing : digital and mixed analogue/digital techniques /

VLSI testing : digital and mixed analogue/digital techniques /

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Bibliographische Detailangaben
1. Verfasser: Hurst, S. L. (Stanley Leonard)
Körperschaft: Institution of Electrical Engineers
Format: Buch
Sprache:English
Veröffentlicht: London : Institution of Electrical Engineers, c1998.
Schriftenreihe:IEE circuits, devices and systems series ; v. 9
Schlagworte:
Integrated circuits > Very large scale integration > Design and construction.
Computer-aided design.
Integrated services digital networks > Testing.

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