VLSI testing : digital and mixed analogue/digital techniques /
Saved in:
| Main Author: | |
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| Corporate Author: | |
| Format: | Book |
| Language: | English |
| Published: |
London :
Institution of Electrical Engineers,
c1998.
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| Series: | IEE circuits, devices and systems series ;
v. 9 |
| Subjects: |
CARM 1 Store
| Call Number: |
A2:AQ22G0 C08462 |
|---|---|
| Copy 1 | Available Place a Hold |