The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements /
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| Main Author: | |
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| Corporate Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Gaithersburg, MD :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
1999.
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| Edition: | 1999 edition. |
| Series: | Standard reference materials
NIST special publication ; 260-131 |
| Subjects: |
CARM 1 Store
| Call Number: |
A2:AB22H0 F01159 |
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| Copy 1 | Available Place a Hold |