APA引文

Ehrstein, J. R., & Croarkin, M. C. (1999). The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements (1999 edition.). U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.

Chicago Style (17th ed.) Citation

Ehrstein, James R., and M. C. Croarkin. The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements. 1999 edition. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.

MLA引文

Ehrstein, James R., and M. C. Croarkin. The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements. 1999 edition. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.