Ehrstein, J. R., & Croarkin, M. C. (1999). The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements (1999 edition.). U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.
芝加哥风格引文Ehrstein, James R., 与 M. C. Croarkin. The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements. 1999 edition. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.
MLA引文Ehrstein, James R., 与 M. C. Croarkin. The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements. 1999 edition. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.