Reliability physics.

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Bibliographic Details
New Title:	IEEE international reliability physics proceedings
Previous Title:	Reliability Physics Symposium. Proceedings
Corporate Authors:	International Reliability Physics Symposium, IEEE Electron Devices Society, IEEE Reliability Society, IEEE Reliability Group, Institute of Electrical and Electronics Engineers. Electron Devices Group
Format:	Conference Proceeding Journal
Language:	English
Published:	New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, 1970-1993.
Subjects:	Electronic apparatus and appliances > Reliability > Congresses > Periodicals. Electronic apparatus and appliances > Testing > Congresses > Periodicals. Integrated circuits > Reliability > Congresses > Periodicals. Integrated circuits > Testing > Congresses > Periodicals.
Online Access:	Click on "Conference proceedings", then search: Reliability Physics Symposium Search: Reliability Physics Symposium Search: Reliability Physics Symposium

Description
Published:	8th (1970)-31st (1993)
Item Description:	Has subtitle: ... annual proceedings, 11th (1973)-. Description based on: 19th (Apr. 7-9, 1981).
Physical Description:	24 v. : ill. ; 28 cm. Beginning with issue for 1988, also available by subscription, in PDF format, via the World Wide Web.
Publication Frequency:	Annual
Bibliography:	Includes bibliographical references.
ISBN:	0780373529
ISSN:	0735-0791

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