Properties of amorphous silicon.

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Bibliographic Details
Corporate Author: INSPEC (Information service)
Format: Book
Language:English
Published: London ; New York : INSPEC, the Institution of Electrical Engineers, c1989.
Edition:2nd ed.
Series:EMIS datareviews series ; no. 1
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CARM 1 Store

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Call Number: A1:AO02F0 F02127
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