Properties of amorphous silicon.

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Bibliographic Details
Corporate Author: INSPEC (Information service)
Format: Book
Language:English
Published: London ; New York : INSPEC, the Institution of Electrical Engineers, c1989.
Edition:2nd ed.
Series:EMIS datareviews series ; no. 1
Subjects:
Description
Item Description:Previous ed. : 1985.
Physical Description:xxii, 656 p. ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0852964803