Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface /
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Fformat: | Traethawd Ymchwil Llyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Ann Arbor, MI :
University Microfilms International,
c1987.
|
| Pynciau: |
CARM 1 Store
| Rhif Galw: |
A1:AN09F0 C09696 |
|---|---|
| Copi 1 | Ar gael Gwneud Cais |