Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface /
Guardat en:
| Autor principal: | |
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| Format: | Thesis Llibre |
| Idioma: | English |
| Publicat: |
Ann Arbor, MI :
University Microfilms International,
c1987.
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| Matèries: |
CARM 1 Store
| Signatura: |
A1:AN09F0 C09696 |
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| Còpia 1 | Disponible Fer una reserva |