Modeling the process dependence of electrical charges associated with the silicon/silicon-dioxide interface /
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| Format: | Thesis Bog |
| Sprog: | English |
| Udgivet: |
Ann Arbor, MI :
University Microfilms International,
c1987.
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| Fag: |
| Fysisk beskrivelse: | xxii, 157 p. : ill. ; 22 cm. |
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| Bibliografi: | Bibliography: p. 135-157. |