IEEE transactions on pattern analysis and machine intelligence.
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| Corporate Authors: | , |
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| Format: | Journal |
| Language: | English |
| Published: |
[New York] :
IEEE Computer Society.
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| Subjects: | |
| Online Access: | http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=34 http://ieeexplore.ieee.org/servlet/opac?punumber=34 Click on "Go to IEL", then "Search", then "Journals"; scroll down to: Pattern Analysis and Machine Intelligence http://www.computer.org/tpami |
Internet
http://ieeexplore.ieee.org/lpdocs/epic03/RecentIssues.htm?punumber=34http://ieeexplore.ieee.org/servlet/opac?punumber=34
Click on "Go to IEL", then "Search", then "Journals"; scroll down to: Pattern Analysis and Machine Intelligence
http://www.computer.org/tpami
CARM 1 Store
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A3:AB38D0 F05672 A3:AB38D0 F05675 A3:AD08E0 F05849 A3:AD08E0 F05851 A3:AD13D0 F05694 A3:AD14D0 F05806 A3:AD14D0 F05807 A3:AD20E0 F05770 A3:AD25E0 F05751 A3:AD25E0 F05756 |
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