Development of a testing methodology to predict optical disk life expectancy values /
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| Main Author: | |
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| Corporate Author: | |
| Format: | Book |
| Language: | English |
| Published: |
Gaithersburg, Md. :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
1991.
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| Series: | NIST special publication ;
500-200. NIST special publication. Computer systems technology. |
| Subjects: |
CARM 1 Store
| Call Number: |
A3:AE21C0 F06303 |
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| Copy 1 | Available Place a Hold |