Podio, F. L. (1991). Development of a testing methodology to predict optical disk life expectancy values. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.
Chicago Style (17th ed.) CitationPodio, Fernando L. Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values. Gaithersburg, Md.: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1991.
MLA (8th ed.) CitationPodio, Fernando L. Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1991.
Warning: These citations may not always be 100% accurate.