Podio, F. L. (1991). Development of a testing methodology to predict optical disk life expectancy values. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.
Lua i Stíl Chicago (17ú heag.)Podio, Fernando L. Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values. Gaithersburg, Md.: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1991.
Lua MLA (8ú heag.)Podio, Fernando L. Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1991.
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