Development of a testing methodology to predict optical disk life expectancy values /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Gaithersburg, Md. :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
1991.
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| Series: | NIST special publication ;
500-200. NIST special publication. Computer systems technology. |
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| Item Description: | Distributed to depository libraries in microfiche. Shipping list no.: 92-2116-M. "December 1991." |
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| Physical Description: | xv, 84 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographical references (p. 83-84) |