Development of a testing methodology to predict optical disk life expectancy values /

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Bibliographic Details
Main Author: Podio, Fernando L.
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Book
Language:English
Published: Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1991.
Series:NIST special publication ; 500-200.
NIST special publication. Computer systems technology.
Subjects:
Description
Item Description:Distributed to depository libraries in microfiche.
Shipping list no.: 92-2116-M.
"December 1991."
Physical Description:xv, 84 p. : ill. ; 28 cm.
Bibliography:Includes bibliographical references (p. 83-84)