Development of a testing methodology to predict optical disk life expectancy values /

Development of a testing methodology to predict optical disk life expectancy values /

Guardado en:
Detalles Bibliográficos
Autor principal: Podio, Fernando L.
Autor Corporativo: National Institute of Standards and Technology (U.S.)
Formato: Libro
Lenguaje:English
Publicado: Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1991.
Colección:NIST special publication ; 500-200.
NIST special publication. Computer systems technology.
Materias:
Optical disks > Testing.
Service life (Engineering)
Descripción
Notas:Distributed to depository libraries in microfiche.
Shipping list no.: 92-2116-M.
"December 1991."
Descripción Física:xv, 84 p. : ill. ; 28 cm.
Bibliografía:Includes bibliographical references (p. 83-84)

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