Development of a testing methodology to predict optical disk life expectancy values /

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Bibliographic Details
Main Author: Podio, Fernando L.
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Book
Language:English
Published: Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1991.
Series:NIST special publication ; 500-200.
NIST special publication. Computer systems technology.
Subjects:
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019 1 |a 41905436  |5 LACONCORD2021 
040 |a VCAV  |c VCAV 
100 1 |a Podio, Fernando L. 
245 1 0 |a Development of a testing methodology to predict optical disk life expectancy values /  |c Fernando L. Podio. 
260 |a Gaithersburg, Md. :  |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,  |c 1991. 
300 |a xv, 84 p. :  |b ill. ;  |c 28 cm. 
490 1 |a NIST special publication ;  |v 500-200.  |a Computer systems technology 
500 |a Distributed to depository libraries in microfiche. 
500 |a Shipping list no.: 92-2116-M. 
500 |a "December 1991." 
504 |a Includes bibliographical references (p. 83-84) 
536 |a Sponsored by U.S. National Archives and Records Administration. 
650 0 |a Optical disks  |x Testing. 
650 0 |a Service life (Engineering) 
710 2 |a National Institute of Standards and Technology (U.S.) 
830 0 |a NIST special publication ;  |v 500-200. 
830 0 |a NIST special publication.  |p Computer systems technology. 
852 8 |b CARM  |h A3:AE21C0  |i F06303  |p 0516319  |f BK 
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952 f f |p Can circulate  |a CAVAL  |b CAVAL  |c CAVAL  |d CARM 1 Store  |e F06303  |f A3:AE21C0  |h Other scheme  |i book  |m 0516319