Development of a testing methodology to predict optical disk life expectancy values /
Gespeichert in:
| 1. Verfasser: | |
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| Körperschaft: | |
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Gaithersburg, Md. :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
1991.
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| Schriftenreihe: | NIST special publication ;
500-200. NIST special publication. Computer systems technology. |
| Schlagworte: |
CARM 1 Store
| Signatur: |
A3:AE21C0 F06303 |
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| Exemplar 1 | Verfügbar Bestellen |