HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	Albers, John
निगमित लेखक:	National Institute of Standards and Technology (U.S.)
स्वरूप:	पुस्तक
भाषा:	English
प्रकाशित:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
श्रृंखला:	NIST special publication ; 400-96. Semiconductor measurement technology.
विषय:	Semiconductors > Thermal properties. Thermal analysis > Computer programs. Fourier analysis > Data processing.

विवरण
वस्तु वर्णन:	"August 1995."
भौतिक वर्णन:	vi, 87 p. ; 28 cm.
ग्रन्थसूची:	Includes bibliographical references (p. 47-49)

समान संसाधन