HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /

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Bibliografski detalji
Glavni autor: Albers, John
Autor kompanije: National Institute of Standards and Technology (U.S.)
Format: Knjiga
Jezik:English
Izdano: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Serija:NIST special publication ; 400-96.
Semiconductor measurement technology.
Teme:
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040 |a LC  |b eng  |c LC  |d LC 
042 |a lccopycat 
050 0 0 |a QC100  |b .U57 no. 400-96  |a TK7871.85 
100 1 |a Albers, John. 
245 1 0 |a HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /  |c John Albers. 
260 |a Gaithersburg, MD :  |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;  |a Washington, DC :  |b For sale by the Supt. of Docs., U.S. G.P.O.,  |c 1995. 
300 |a vi, 87 p. ;  |c 28 cm. 
490 1 |a Semiconductor measurement technology 
490 1 |a NIST special publication ;  |v 400-96 
500 |a "August 1995." 
504 |a Includes bibliographical references (p. 47-49) 
650 0 |a Semiconductors  |x Thermal properties. 
650 0 |a Thermal analysis  |x Computer programs. 
650 0 |a Fourier analysis  |x Data processing. 
710 2 |a National Institute of Standards and Technology (U.S.) 
830 0 |a NIST special publication ;  |v 400-96. 
830 0 |a Semiconductor measurement technology. 
852 8 |b CARM  |h A3:AE21D0  |i F06324  |p 0523952  |f BK 
999 f f |i 9612f35b-b05c-5562-98b1-f6cfe5364552  |s a0d78585-a144-57d7-950a-522cbd987a48 
952 f f |p Can circulate  |a CAVAL  |b CAVAL  |c CAVAL  |d CARM 1 Store  |e F06324  |f A3:AE21D0  |h Other scheme  |i book  |m 0523952