HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /
Saved in:
| Hovedforfatter: | |
|---|---|
| Institution som forfatter: | |
| Format: | Bog |
| Sprog: | English |
| Udgivet: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
|
| Serier: | NIST special publication ;
400-96. Semiconductor measurement technology. |
| Fag: |
CARM 1 Store
| Klassifikationsnummer: |
A3:AE21D0 F06324 |
|---|---|
| Kopi 1 | Tilgængelig Reservér” |