International Test Conference, IEEE Computer Society. Test Technology Committee, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1983). Proceedings. IEEE Computer Society Press.
Chicago Style (17th ed.) CitationInternational Test Conference, IEEE Computer Society. Test Technology Committee, and Institute of Electrical and Electronics Engineers. Philadelphia Section. Proceedings. Silver Spring, Md.: IEEE Computer Society Press, 1983.
MLA (8th ed.) CitationInternational Test Conference, et al. Proceedings. IEEE Computer Society Press, 1983.
Warning: These citations may not always be 100% accurate.