International Test Conference, IEEE Computer Society. Test Technology Committee, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1983). Proceedings. IEEE Computer Society Press.
Chicago-Zitierstil (17. Ausg.)International Test Conference, IEEE Computer Society. Test Technology Committee, und Institute of Electrical and Electronics Engineers. Philadelphia Section. Proceedings. Silver Spring, Md.: IEEE Computer Society Press, 1983.
MLA-Zitierstil (8. Ausg.)International Test Conference, et al. Proceedings. IEEE Computer Society Press, 1983.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.