International Test Conference, IEEE Computer Society. Test Technology Committee, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1983). Proceedings. IEEE Computer Society Press.
Citação do estilo Chicago (17ª ed.)International Test Conference, IEEE Computer Society. Test Technology Committee, e Institute of Electrical and Electronics Engineers. Philadelphia Section. Proceedings. Silver Spring, Md.: IEEE Computer Society Press, 1983.
Citação MLA (8ª ed.)International Test Conference, et al. Proceedings. IEEE Computer Society Press, 1983.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.