International Test Conference, IEEE Computer Society. Test Technology Committee, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1983). Proceedings. IEEE Computer Society Press.
芝加哥风格引文International Test Conference, IEEE Computer Society. Test Technology Committee, 与 Institute of Electrical and Electronics Engineers. Philadelphia Section. Proceedings. Silver Spring, Md.: IEEE Computer Society Press, 1983.
MLA引文International Test Conference, et al. Proceedings. IEEE Computer Society Press, 1983.
警告：这些引文格式不一定是100％准确.